• Mar 21, 2019 News!Papers published in Vol.7, No.2-No.6 have all received dois from Crossref.
  • Mar 21, 2019 News!IJIEE Vol. 9, No. 1 issue has been published online!   [Click]
  • Dec 11, 2018 News!IJIEE Vol. 8, No. 4 issue has been published online!   [Click]
General Information
    • ISSN: 2010-3719
    • Frequency: Quarterly
    • DOI: 10.18178/IJIEE
    • Editor-in-Chief: Prof. Chandratilak De Silva Liyanage
    • Executive Editor: Jennifer Zeng
    • Abstracting/ Indexing : Google Scholar, Electronic Journals Library, Crossref and ProQuest, Ei (INSPEC, IET).
    • E-mail ijiee@ejournal.net
Editor-in-chief

 
University of Brunei Darussalam, Brunei Darussalam   
" It is a great honor to serve as the editor-in-chief of IJIEE. I'll work together with the editorial team. Hopefully, The value of IJIEE will be well recognized among the readers in the related field."

International Journal of Information and Electronics Engineering

International Journal of Information and Electronics Engineering (IJIEE) is an international academic open access journal which gains a foothold in Singapore, Asia and opens to the world. It aims to promote the integration of information and electronics engineering. The focus is to publish papers on state-of-the-art information and electronics engineering. Submitted papers will be reviewed by technical committees of the Journal and Association. The audience includes researchers, managers and operators for information and electronics engineering as well as designers and developers.
All submitted articles should report original, previously unpublished research results, experimental or theoretical, and will be peer-reviewed. Articles submitted to the journal should meet these criteria and must not be under consideration for publication elsewhere. Manuscripts should follow the style of the journal and are subject to both review and editing.
Featured Article
MInvestigation on Optimum Parameters of Six-Port Reflectometers
Kamil Staszek
In this paper a general investigation on the uncertainty of reflection coefficient measurements with the use of six-port reflectometer is presented. A wide range of both power measurement uncertainty and limited dynamics of the power meters utilized in the six-port systems are incorporated. Based on the conducted analysis the optimum parameters of .....[Read More]
 


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E-mail: ijiee@ejournal.net