Autonomous Driver Assistance System Testing based on Simulation for Adverse Conditions in a Hardware in the Loop Environment . International Journal of Information and Electronics Engineering, [S. l.], v. 14, n. 4, p. 163–171, 2024. DOI: 10.48047/1d4n9d49. Disponível em: https://ijiee.org/index.php/ijiee/article/view/1100. Acesso em: 9 may. 2026.