Measurement and Characterization of FET Devices Using EKV Parameters Applied to POSFET Sensors
Keywords:
Algorithms, flowcharts, piezoelectric semi- conductor, semiconductor device measurements.Abstract
This paper presents an algorithm to extract the
EKV parameters using the input characteristic measurement.
The working of the algorithm was verified by extracting a
parameter through the pinch-off characteristic measurement.
The extraction and measurement was performed on FET
devices present in Piezo-Electric Oxide Semiconductor Field
Effect Transistor (POSFET) sensor. Using the extracted
parameters we fixed the region of operation of this sensor at
weak inversion.
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