“Effects of the Perhydropolysilazane Spin-on-Dielectric Passivation Buffers on the Reliability of AlGaN GaN HEMTs ”. International Journal of Information and Electronics Engineering 3, no. 6 (November 21, 2013): 590–593. Accessed May 2, 2026. http://ijiee.org/index.php/ijiee/article/view/752.