Security-by-Design in API-Driven Systems: Threat Modelling and Mitigation Approaches

Authors

  • Deepak Singh Author

DOI:

https://doi.org/10.48047/ijiee.2023.13.4.11

Keywords:

Security-by-Design (SBD), API Security, API Vulnerabilities, Threat Modelling, API Threats, Mitigation Approaches, API Security Framework, Application Programming Interface (API), Security Architecture, Secure API Development, API Attack Types, Cybersecurity in APIs

Abstract

The purpose of the study is to examine the security-by-design threat modelling and mitigation approaches in API-driven systems. The findings show 

Downloads

Download data is not yet available.

Downloads

Published

15.05.2023

Issue

Vol. 13 No. 4 (2023): volume 13 issue 4(2023)

Section

Articles

License

You are free to:

  1. Share — copy and redistribute the material in any medium or format for any purpose, even commercially.
  2. Adapt — remix, transform, and build upon the material for any purpose, even commercially.
  3. The licensor cannot revoke these freedoms as long as you follow the license terms.

Under the following terms:

  1. Attribution — You must give appropriate credit , provide a link to the license, and indicate if changes were made . You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
  2. No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.

Notices:

You do not have to comply with the license for elements of the material in the public domain or where your use is permitted by an applicable exception or limitation .

No warranties are given. The license may not give you all of the permissions necessary for your intended use. For example, other rights such as publicity, privacy, or moral rights may limit how you use the material.

How to Cite

Security-by-Design in API-Driven Systems: Threat Modelling and Mitigation Approaches . (2023). International Journal of Information and Electronics Engineering, 13(4), 86-94. https://doi.org/10.48047/ijiee.2023.13.4.11