Phase Transitions in Communication Networks with Limited Elements of Valence

Authors

  • I. E. Suleimenov, G. A. Mun, S. V. Panchenko, Z. Tasbulatova, and A. Nurtazin Author

Keywords:

Complex networks, innovation environment, network education, peer education

Abstract

It is shown that the communication networks with 
low-valence elements are able to undergo phase transitions. In the result of them the number of elements having the maximum number of bonds increases discontinuously. Such a phase transition can also be interpreted as a discontinuous transition 
from set of isolated elements to a branched network

Downloads

Download data is not yet available.

Downloads

Published

08.05.2017

Issue

Vol. 7 No. 3 (2017): Volume 7 issue 3 (2017)

Section

Articles

License

You are free to:

  1. Share — copy and redistribute the material in any medium or format for any purpose, even commercially.
  2. Adapt — remix, transform, and build upon the material for any purpose, even commercially.
  3. The licensor cannot revoke these freedoms as long as you follow the license terms.

Under the following terms:

  1. Attribution — You must give appropriate credit , provide a link to the license, and indicate if changes were made . You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
  2. No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.

Notices:

You do not have to comply with the license for elements of the material in the public domain or where your use is permitted by an applicable exception or limitation .

No warranties are given. The license may not give you all of the permissions necessary for your intended use. For example, other rights such as publicity, privacy, or moral rights may limit how you use the material.

How to Cite

Phase Transitions in Communication Networks with Limited Elements of Valence. (2017). International Journal of Information and Electronics Engineering, 7(3), 113-117. https://ijiee.org/index.php/ijiee/article/view/288