MacWilliams Identities of Linear Codes over a Matrix Ring with Respect to Rosenbloom-Tsfasman Metric

Authors

  • Dandan Wang, Minjia Shi, and Yan Liu, Member, IACSIT Author

Keywords:

RT metric, weight enumerator, MacWilliams identity, dual code

Abstract

The definitions of ρ complete weight enumerator 
and exact complete ρ weight enumerator over a matrix ring are given, and the MacWilliams identities with respect to RT metric for the two weight enumerators of linear codes over the matrix ring are obtained, respectively. Finally, we give an example to illustrate our obtained results.

Downloads

Download data is not yet available.

Downloads

Published

05.05.2015

Issue

Vol. 5 No. 3 (2015): Volume 5 issue 3 (2015)

Section

Articles

License

You are free to:

  1. Share — copy and redistribute the material in any medium or format for any purpose, even commercially.
  2. Adapt — remix, transform, and build upon the material for any purpose, even commercially.
  3. The licensor cannot revoke these freedoms as long as you follow the license terms.

Under the following terms:

  1. Attribution — You must give appropriate credit , provide a link to the license, and indicate if changes were made . You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
  2. No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.

Notices:

You do not have to comply with the license for elements of the material in the public domain or where your use is permitted by an applicable exception or limitation .

No warranties are given. The license may not give you all of the permissions necessary for your intended use. For example, other rights such as publicity, privacy, or moral rights may limit how you use the material.

How to Cite

MacWilliams Identities of Linear Codes over a Matrix Ring with Respect to Rosenbloom-Tsfasman Metric. (2015). International Journal of Information and Electronics Engineering, 5(3), 184-188. https://ijiee.org/index.php/ijiee/article/view/410