Junctionless CMOS Transistors with Independent Double Gates

Authors

  • A. Kamath, Z. X. Chen, N. Shen, X. Li, N. Singh, G. Q. Lo, and D.-L. Kwong Author

Keywords:

CMOS, junctionless, independent gates

Abstract

Scaling is getting challenging with every 
technology node. Implant process requirements for defining 
conformal junctions in 3D device are very stringent. In addition, 
defining gate over topography is limited by lithography. Our 
solution to these problems is a novel junction-less FiNFET like 
transistor.  Unlike conventional FiNFET the gate definition in 
this device is lithography independent. The fabricated NMOS 
and PMOS shows good transistor characteristics: ION =52.3 
uA/um, ION/IOFF ratio = 107, SS = 92mV/dec for NMOS and 
ION =15.4 uA/um, ION/IOFF ratio = 105, SS = 90mV/dec for 
PMOS. We also show inverter VTC characteristics fabricated 
using this NMOS and PMOS.  

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Published

17.01.2013

How to Cite

Junctionless CMOS Transistors with Independent Double Gates. (2013). International Journal of Information and Electronics Engineering, 3(1), 13-15. https://ijiee.org/index.php/ijiee/article/view/614